SN74ABT18640DGGR
Texas Instruments
Texas Instruments
IC SCAN-TEST-DEV/TXRX 56-TSSOP
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The SN74ABT18640DGGR from Texas Instruments represents cutting-edge Specialty Logic ICs designed for advanced digital systems. These integrated circuits deliver superior performance in complex logic operations, offering enhanced speed and reliability compared to standard logic devices. Our Specialty Logic ICs feature innovative architectures optimized for specific applications, providing precise timing control and efficient power management. These components are widely used in high-speed data processing, telecommunications infrastructure, and industrial automation systems. For instance, the SN74ABT18640DGGR excels in network routers, medical imaging equipment, and aerospace control systems where specialized logic functions are critical. Choose Texas Instruments's Specialty Logic solutions for your most demanding digital design challenges.
Specifications
- Product Status: Obsolete
- Logic Type: Scan Test Device with Inverting Bus Transceivers
- Supply Voltage: 4.5V ~ 5.5V
- Number of Bits: 18
- Operating Temperature: -40°C ~ 85°C
- Mounting Type: Surface Mount
- Package / Case: 56-TFSOP (0.240", 6.10mm Width)
- Supplier Device Package: 56-TSSOP
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