Shopping cart

Subtotal: $0.00

SN74ABT18652PM

Texas Instruments
SN74ABT18652PM Preview
Texas Instruments
IC SCAN-TEST-DEV/TXRX 64-LQFP
$14.03
Available to order
Reference Price (USD)
1+
$19.89000
10+
$18.28300
25+
$17.52520
160+
$15.44100
640+
$13.73584
Exquisite packaging
Discount
TT / Paypal / Credit Card / Western Union / Money Gram

Specifications

  • Product Status: Active
  • Logic Type: Scan Test Device With Transceivers And Registers
  • Supply Voltage: 4.5V ~ 5.5V
  • Number of Bits: 18
  • Operating Temperature: -40°C ~ 85°C
  • Mounting Type: Surface Mount
  • Package / Case: 64-LQFP
  • Supplier Device Package: 64-LQFP (10x10)

Related Products

Nexperia USA Inc.

74LVC1GX04GW-Q100H

National Semiconductor

4007UBDC

Texas Instruments

SN74S1053DWR

Harris Corporation

CD4008BD3

Texas Instruments

SN74SSTU32864GKER

Advanced Micro Devices

AM2954DC

Top