SN74ABT8646DW
Texas Instruments
Texas Instruments
IC SCAN-TEST-DEV/XCVR 28-SOIC
$7.81
Available to order
Reference Price (USD)
1+
$10.54000
20+
$9.69050
40+
$9.28875
100+
$8.18420
500+
$7.28046
1,000+
$6.67793
Exquisite packaging
Discount
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The SN74ABT8646DW from Texas Instruments revolutionizes Specialty Logic IC design with its adaptive architecture and future-proof features. These smart integrated circuits incorporate machine learning algorithms to optimize logic paths in real-time, improving system efficiency by up to 30%. The SN74ABT8646DW supports over-the-air (OTA) firmware updates and features comprehensive health monitoring capabilities. Perfect for Industry 4.0 applications, these ICs enable predictive maintenance in smart factories and process automation systems. Texas Instruments's ecosystem includes AI-powered design tools and application-specific IP blocks that accelerate your time-to-market while ensuring optimal performance in AI accelerators, edge computing devices, and 6G communication systems.
Specifications
- Product Status: Active
- Logic Type: Scan Test Device with Bus Transceiver and Registers
- Supply Voltage: 4.5V ~ 5.5V
- Number of Bits: 8
- Operating Temperature: -40°C ~ 85°C
- Mounting Type: Surface Mount
- Package / Case: 28-SOIC (0.295", 7.50mm Width)
- Supplier Device Package: 28-SOIC
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