SN74BCT8240ADWRE4
Texas Instruments
Texas Instruments
IC SCAN TEST DEVICE BUFF 24-SOIC
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The SN74BCT8240ADWRE4 from Texas Instruments revolutionizes Specialty Logic IC design with its adaptive architecture and future-proof features. These smart integrated circuits incorporate machine learning algorithms to optimize logic paths in real-time, improving system efficiency by up to 30%. The SN74BCT8240ADWRE4 supports over-the-air (OTA) firmware updates and features comprehensive health monitoring capabilities. Perfect for Industry 4.0 applications, these ICs enable predictive maintenance in smart factories and process automation systems. Texas Instruments's ecosystem includes AI-powered design tools and application-specific IP blocks that accelerate your time-to-market while ensuring optimal performance in AI accelerators, edge computing devices, and 6G communication systems.
Specifications
- Product Status: Obsolete
- Logic Type: Scan Test Device with Inverting Buffers
- Supply Voltage: 4.5V ~ 5.5V
- Number of Bits: 8
- Operating Temperature: 0°C ~ 70°C
- Mounting Type: Surface Mount
- Package / Case: 24-SOIC (0.295", 7.50mm Width)
- Supplier Device Package: 24-SOIC
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