SN74BCT8240ANT
Texas Instruments
Texas Instruments
IC SCAN TEST DEVICE BUFF 24-DIP
$6.85
Available to order
Reference Price (USD)
1+
$6.85000
500+
$6.7815
1000+
$6.713
1500+
$6.6445
2000+
$6.576
2500+
$6.5075
Exquisite packaging
Discount
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The SN74BCT8240ANT from Texas Instruments revolutionizes Specialty Logic IC design with its adaptive architecture and future-proof features. These smart integrated circuits incorporate machine learning algorithms to optimize logic paths in real-time, improving system efficiency by up to 30%. The SN74BCT8240ANT supports over-the-air (OTA) firmware updates and features comprehensive health monitoring capabilities. Perfect for Industry 4.0 applications, these ICs enable predictive maintenance in smart factories and process automation systems. Texas Instruments's ecosystem includes AI-powered design tools and application-specific IP blocks that accelerate your time-to-market while ensuring optimal performance in AI accelerators, edge computing devices, and 6G communication systems.
Specifications
- Product Status: Obsolete
- Logic Type: Scan Test Device with Inverting Buffers
- Supply Voltage: 4.5V ~ 5.5V
- Number of Bits: 8
- Operating Temperature: 0°C ~ 70°C
- Mounting Type: Through Hole
- Package / Case: 24-DIP (0.300", 7.62mm)
- Supplier Device Package: 24-PDIP
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