SN74BCT8244ANTG4
Texas Instruments
Texas Instruments
IC SCAN TEST DEVICE BUFF 24-DIP
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Texas Instruments's SN74BCT8244ANTG4 Specialty Logic ICs offer unmatched versatility for modern digital designs. These innovative integrated circuits combine multiple specialty functions including clock distribution, signal multiplexing, and power sequencing in energy-efficient packages. The SN74BCT8244ANTG4 series supports operation across military temperature ranges with radiation-hardened options available for aerospace applications. Key benefits include reduced system complexity, lower BOM costs, and improved reliability through fewer interconnects. Application examples include satellite communication systems, autonomous vehicle sensors, and industrial motor drives. Choose Texas Instruments for Specialty Logic ICs that meet the most stringent quality certifications including AEC-Q100 Grade 1 and MIL-PRF-38535 Class K.
Specifications
- Product Status: Obsolete
- Logic Type: Scan Test Device with Buffers
- Supply Voltage: 4.5V ~ 5.5V
- Number of Bits: 8
- Operating Temperature: 0°C ~ 70°C
- Mounting Type: Through Hole
- Package / Case: 24-DIP (0.300", 7.62mm)
- Supplier Device Package: 24-PDIP
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