SN74BCT8245ANTG4
Texas Instruments
Texas Instruments
IC SCAN TEST DEVICE TXRX 24-DIP
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Meet the SN74BCT8245ANTG4 - Texas Instruments's high-reliability Specialty Logic IC for mission-critical applications. These ruggedized integrated circuits feature enhanced EMC performance, single-event upset (SEU) immunity, and predictive fault detection algorithms. The SN74BCT8245ANTG4 delivers industry-leading MTBF ratings exceeding 1 million hours, making it ideal for defense systems, oil/gas exploration equipment, and railway signaling infrastructure. Key differentiators include our patented noise cancellation technology and -55 C to +150 C junction temperature operation. Trust Texas Instruments's decades of experience in high-reliability semiconductor manufacturing for your most challenging environments.
Specifications
- Product Status: Obsolete
- Logic Type: Scan Test Device with Bus Transceivers
- Supply Voltage: 4.5V ~ 5.5V
- Number of Bits: 8
- Operating Temperature: 0°C ~ 70°C
- Mounting Type: Through Hole
- Package / Case: 24-DIP (0.300", 7.62mm)
- Supplier Device Package: 24-PDIP
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