SN74BCT8373ADW
Texas Instruments
Texas Instruments
IC SCAN TEST DEVICE LATCH 24SOIC
$7.01
Available to order
Reference Price (USD)
75+
$9.23320
Exquisite packaging
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Meet the SN74BCT8373ADW - Texas Instruments's high-reliability Specialty Logic IC for mission-critical applications. These ruggedized integrated circuits feature enhanced EMC performance, single-event upset (SEU) immunity, and predictive fault detection algorithms. The SN74BCT8373ADW delivers industry-leading MTBF ratings exceeding 1 million hours, making it ideal for defense systems, oil/gas exploration equipment, and railway signaling infrastructure. Key differentiators include our patented noise cancellation technology and -55 C to +150 C junction temperature operation. Trust Texas Instruments's decades of experience in high-reliability semiconductor manufacturing for your most challenging environments.
Specifications
- Product Status: Active
- Logic Type: Scan Test Device with D-Type Latches
- Supply Voltage: 4.5V ~ 5.5V
- Number of Bits: 8
- Operating Temperature: 0°C ~ 70°C
- Mounting Type: Surface Mount
- Package / Case: 24-SOIC (0.295", 7.50mm Width)
- Supplier Device Package: 24-SOIC
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