SN74BCT8374ADWR
Texas Instruments
Texas Instruments
IC SCAN TEST DEVICE W/FF 24-SOIC
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The SN74BCT8374ADWR by Texas Instruments sets new standards in Specialty Logic IC performance. These advanced components integrate multiple logic functions into single-chip solutions, reducing board space by up to 60% compared to discrete implementations. Featuring configurable I/O standards (LVCMOS, LVDS, HSTL), the SN74BCT8374ADWR enables seamless interfacing between diverse system components. With propagation delay matching within 50ps across channels, these ICs are perfect for high-speed data acquisition systems, test equipment, and broadcast video processing. Texas Instruments's patented power management technology extends battery life in portable applications while maintaining signal integrity at data rates up to 3.2Gbps.
Specifications
- Product Status: Obsolete
- Logic Type: Scan Test Device with D-Type Edge-Triggered Flip-Flops
- Supply Voltage: 4.5V ~ 5.5V
- Number of Bits: 8
- Operating Temperature: 0°C ~ 70°C
- Mounting Type: Surface Mount
- Package / Case: 24-SOIC (0.295", 7.50mm Width)
- Supplier Device Package: 24-SOIC
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