SN74BCT8374ANT
Texas Instruments
Texas Instruments
IC SCAN TEST DEVICE W/FF 24-DIP
$4.13
Available to order
Reference Price (USD)
1+
$4.13000
500+
$4.0887
1000+
$4.0474
1500+
$4.0061
2000+
$3.9648
2500+
$3.9235
Exquisite packaging
Discount
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Texas Instruments's SN74BCT8374ANT Specialty Logic ICs provide intelligent solutions for sophisticated digital systems. These versatile integrated circuits incorporate advanced features like dynamic phase adjustment, glitch-free switching, and fail-safe input protection. The SN74BCT8374ANT series supports operation from 1.8V to 3.3V core voltages with 5V-tolerant inputs, simplifying mixed-voltage system design. Application highlights include enterprise storage systems, industrial automation controllers, and next-generation gaming hardware. Texas Instruments backs every SN74BCT8374ANT IC with comprehensive technical documentation, evaluation kits, and world-class application engineering support to ensure your design success from prototype to production.
Specifications
- Product Status: Obsolete
- Logic Type: Scan Test Device with D-Type Edge-Triggered Flip-Flops
- Supply Voltage: 4.5V ~ 5.5V
- Number of Bits: 8
- Operating Temperature: 0°C ~ 70°C
- Mounting Type: Through Hole
- Package / Case: 24-DIP (0.300", 7.62mm)
- Supplier Device Package: 24-PDIP
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