SN74LVTH18504APM
Texas Instruments
Texas Instruments
IC SCAN-TEST-DEV/XCVR 64-LQFP
$6.72
Available to order
Reference Price (USD)
1+
$6.72000
500+
$6.6528
1000+
$6.5856
1500+
$6.5184
2000+
$6.4512
2500+
$6.384
Exquisite packaging
Discount
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The SN74LVTH18504APM by Texas Instruments sets new standards in Specialty Logic IC performance. These advanced components integrate multiple logic functions into single-chip solutions, reducing board space by up to 60% compared to discrete implementations. Featuring configurable I/O standards (LVCMOS, LVDS, HSTL), the SN74LVTH18504APM enables seamless interfacing between diverse system components. With propagation delay matching within 50ps across channels, these ICs are perfect for high-speed data acquisition systems, test equipment, and broadcast video processing. Texas Instruments's patented power management technology extends battery life in portable applications while maintaining signal integrity at data rates up to 3.2Gbps.
Specifications
- Product Status: Active
- Logic Type: ABT Scan Test Device With Universal Bus Transceivers
- Supply Voltage: 2.7V ~ 3.6V
- Number of Bits: 20
- Operating Temperature: -40°C ~ 85°C
- Mounting Type: Surface Mount
- Package / Case: 64-LQFP
- Supplier Device Package: 64-LQFP (10x10)
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