SN74BCT8373ANT
Texas Instruments
Texas Instruments
IC SCAN TEST DEVICE LATCH 24-DIP
$5.55
Available to order
Reference Price (USD)
1+
$5.55000
500+
$5.4945
1000+
$5.439
1500+
$5.3835
2000+
$5.328
2500+
$5.2725
Exquisite packaging
Discount
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Engineered for excellence, the SN74BCT8373ANT Specialty Logic IC from Texas Instruments delivers specialized digital solutions for next-generation electronics. These high-performance integrated circuits feature advanced architectures for functions like error correction, data scrambling, and parallel-to-serial conversion. The SN74BCT8373ANT boasts impressive specifications: 10Gbps throughput, jitter performance under 1ps RMS, and power consumption below 100mW per channel. Ideal applications include data center networking equipment, high-frequency trading systems, and advanced driver assistance systems (ADAS). Texas Instruments's commitment to innovation ensures your designs stay ahead with features like in-system programmability and live insertion capability for hot-swappable systems.
Specifications
- Product Status: Obsolete
- Logic Type: Scan Test Device with D-Type Latches
- Supply Voltage: 4.5V ~ 5.5V
- Number of Bits: 8
- Operating Temperature: 0°C ~ 70°C
- Mounting Type: Through Hole
- Package / Case: 24-DIP (0.300", 7.62mm)
- Supplier Device Package: 24-PDIP
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